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Applied Physics Letters

Volumn 93, Issue 23, 2008, Pages

Probing antiphase boundaries in Fe3O4 thin films using micro-Raman spectroscopy

(3) Tiwari, Shailja a Phase, D M a Choudhary, R J a

a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH (India)

Author keywords

[No Author keywords available]

Indexed keywords

PHONONS; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SINGLE CRYSTALS; SPECTRUM ANALYSIS; SUBSTRATES;

ANTIPHASE BOUNDARIES; COMBINED EFFECTS; MGO SUBSTRATES; PHONON COUPLINGS; RAMAN STUDIES; SI SUBSTRATES; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 57649132912 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3046788 Document Type: Article

Times cited : (44)

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