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Volumn 2, Issue , 2006, Pages 365-370

Simple image acquisition system optoelectronic analysis

Author keywords

Aberrations; CCD; LSI; MTF; PSF

Indexed keywords

ABERRATIONS; CHARGE COUPLED DEVICES; GEOMETRICAL OPTICS; IMAGE SENSORS; LENSES; OPTICAL SENSORS; OPTICAL TRANSFER FUNCTION;

EID: 57649099204     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AQTR.2006.254661     Document Type: Conference Paper
Times cited : (4)

References (22)
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  • 5
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    • Izuka, K.1
  • 14
    • 85022338134 scopus 로고    scopus 로고
    • www.thorlabs.com
  • 15
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    • Prof. A. El Gamal
    • www.stanford.edu Prof. A. El Gamal
  • 16
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    • www.imageval.com
  • 17
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    • www.dalsa.com
  • 18
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    • Prof. E. Dereniak
    • www.optics.arizona.edu Prof. E. Dereniak
  • 19
    • 85022342083 scopus 로고    scopus 로고
    • Integrating lenses design with digital camera simulation
    • Image Quality and System Performance, Miyake and Rasmussen (Eds). January
    • J. E. Farrell, F. Xiao, P. Catrysse, B. Wandell, "Integrating lenses design with digital camera simulation" Proc. SPIE Vol. 5294, p. 124-131, Image Quality and System Performance, Miyake and Rasmussen (Eds). January 2005
    • (2005) Proc. SPIE , vol.5294 , pp. 124-131
    • Farrell, J.E.1    Xiao, F.2    Catrysse, P.3    Wandell, B.4
  • 20
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    • A simulation tool for evaluating digital camera image quality
    • Image Quality and System Performance, Miyake and Rasmussen (Eds). January
    • J. E. Farrell, F. Xiao, P. Catrysse, B. Wandell, "A simulation tool for evaluating digital camera image quality" Proc. SPIE Vol. 5294, p. 124-131, Image Quality and System Performance, Miyake and Rasmussen (Eds). January 2005
    • (2005) Proc. SPIE , vol.5294 , pp. 124-131
    • Farrell, J.E.1    Xiao, F.2    Catrysse, P.3    Wandell, B.4
  • 21
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    • A 35 mm 13.89 million pixel CMOS active pixel image sensor
    • FillFactory, Mechelen, Belgium, May 15-17, Elmau, Germany
    • G. Meynants, B. Dierickx, A. Alaerts, D. Uwaerts, S. Cos, D. Scheffer FillFactory, Mechelen, Belgium," A 35 mm 13.89 Million Pixel CMOS Active Pixel Image Sensor", IEEE Workshop on CCD & AIS, May 15-17, 2003, Elmau, Germany
    • (2003) IEEE Workshop on CCD & AIS
    • Meynants, G.1    Dierickx, B.2    Alaerts, A.3    Uwaerts, D.4    Cos, S.5    Scheffer, D.6
  • 22
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    • Optical efficiency of image sensor pixels
    • P. B. Catrysse and B. A. Wandell (2002)," Optical efficiency of image sensor pixels" JOSA A, Vol. 19, No. 8, pp. 1610-1620
    • (2002) JOSA A , vol.19 , Issue.8 , pp. 1610-1620
    • Catrysse, P.B.1    Wandell, B.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.