Tuning flux-pinning in epitaxial NdBa2Cu3O 7-δ films via engineered, hybrid nanoscale defect structures

Applied Physics Express

Volumn 1, Issue 11, 2008, Pages 1117021-1117023

  Wee, Sung Hun ^a,b   Goyal, Amit ^a   Zuev, Yuri L ^a   Cantoni, Claudia ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEFECT STRUCTURES; DEFECTS; EPITAXIAL FILMS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; TUNING;

ANGULAR DEPENDENCES; ANGULAR VARIATIONS; C -AXIS; CRITICAL CURRENT DENSITIES; NANODOT ARRAYS; NANOSCALE DEFECTS; THICKNESS OF THE FILMS; TRANSMISSION ELECTRON MICROSCOPY IMAGES;

COPPER;

EID: 57649099010     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.1.111702     Document Type: Article

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