Predicting fault-prone modules based on metrics transitions

DEFECTS'08: 2008 International Symposium on Software Testing and Analysis - Proceedings of the 2008 Workshop on Defects in Large Software Systems 2008, DEFECTS'08

Volumn , Issue , 2008, Pages 6-10

  Higo, Yoshiki ^a   Murao, Kenji ^a   Kusumoto, Shinji ^a   Inoue, Katsuro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CASE STUDIES; SOFTWARE QUALITIES; SOFTWARE REPOSITORIES; SOFTWARE SYSTEMS; SOURCE CODES;

COMPUTER SOFTWARE; COMPUTER SOFTWARE SELECTION AND EVALUATION; DEFECTS; TECHNICAL PRESENTATIONS;

SOFTWARE TESTING;

EID: 57349177159     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1390817.1390820     Document Type: Conference Paper

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