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Volumn 88, Issue 6, 2008, Pages 386-388
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Nonlinear refraction in nanocrystalline silicon carbide films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 57349137204
PISSN: 00213640
EISSN: 10906487
Source Type: Journal
DOI: 10.1134/S0021364008180094 Document Type: Article |
Times cited : (13)
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References (10)
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