Uncertainties when using dual-wavelength or single-wavelength spectrophotometry to monitor the course of hexavalent chromium reduction mediated by zero-valent iron

Accreditation and Quality Assurance

Volumn 13, Issue 12, 2008, Pages 711-716

  Rivero Huguet, Mario ^a   Marshall, William D ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

Dual wavelength spectrophotometry; Hexavalent chromium; Trace analysis; Uncertainty measurement; UV vis spectrophotometry

Indexed keywords

EID: 57349117730     PISSN: 09491775     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00769-008-0450-2     Document Type: Article

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