Layered interval codes for TCAM-based classification

SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems

Volumn 36, Issue 1 SPECIAL ISSUE, 2008, Pages 445-446

  Bremler Barr, Anat ^a   Hay, David ^b   Farber, Boris ^a   Hendler, Danny ^b  

^a INTERDISCIPLINARY CENTER   (Israel)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

Classification; TCAM

Indexed keywords

EID: 57349114622     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1375457.1375513     Document Type: Conference Paper

References (8)

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