Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 26, Issue 6, 2008, Pages 2168-2173

  Dhawan, A ^a,b   Muth, J F ^c   Leonard, D N ^d   Gerhold, M D ^a   Gleeson, J ^d   Vo Dinh, T ^b   Russell, P E ^d  

^a U S ARMY RESEARCH OFFICE   (United States)

^b Duke University   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

^d APPALACHIAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL AGENTS; CHEMICAL SENSING APPLICATIONS; EXTRAORDINARY TRANSMISSIONS; FIB MILLINGS; LIQUID MEDIAS; METALLIC NANOPILLARS; METALLIC NANORODS; METALLIC NANOSTRUCTURES; MULTIMODE; NANO HOLES; NANO PILLARS; ORDERED ARRAYS; PERIODIC ARRAYS; PLASMON RESONANCES; PLASMONICS; REFRACTIVE INDEX CHANGES; SENSING MECHANISMS; SURFACE PLASMONS; THICK METALLIC FILMS;

CHEMICAL SENSORS; DEMULTIPLEXING; FABRICATION; FIBER OPTIC SENSORS; FIBERS; FOCUSED ION BEAMS; LIGHT REFRACTION; LIGHT TRANSMISSION; METALLIC FILMS; METALLIC SOAPS; MILLING (MACHINING); MULTIMODE FIBERS; NANORODS; NANOSTRUCTURES; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; OPTICAL MATERIALS; OPTICAL PROPERTIES; OPTICAL SENSORS; ORGANIC POLYMERS; PLASMONS; REFRACTIVE INDEX; REFRACTOMETERS; RESONANCE; SENSORS; SILVER; SURFACE PLASMON RESONANCE;

OPTICAL FILMS;

ASSEMBLY; FIBER OPTICS; FIBERS; FILM; OPTICAL MATERIALS; REFRACTIVITY; REFRACTOMETERS; RESONANCE; SENSORS; SILVER; TRANSMITTANCE;

EID: 57249105000     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3013329     Document Type: Article

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