Research progress in crop yield estimation models based on spectral reflectance data

Nongye Gongcheng Xuebao/Transactions of the Chinese Society of Agricultural Engineering

Volumn 24, Issue 10, 2008, Pages 262-268

  Yang, Peng ^a,b,c   Wu, Wenbin ^a,b,c   Zhou, Qingbo ^a,b   Zha, Yan ^b  

^a AGRO ENVIRONMENTAL PROTECTION INSTITUTE   (China)

^b INSTITUTE OF PLANT PROTECTION   (China)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

Crop yield; Estimation model; Remote sensing; Spectral reflectance; Vegetation index

Indexed keywords

EID: 57249098159     PISSN: 10026819     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (73)