Influence of Zn on the oxide layer on AISI 316L(NG) stainless steel in simulated pressurised water reactor coolant

Electrochimica Acta

Volumn 54, Issue 3, 2009, Pages 1056-1069

  Betova, Iva ^a   Bojinov, Martin ^b   Kinnunen, Petri ^c   Lundgren, Klas ^d   Saario, Timo ^c  

^a TECHNICAL UNIVERSITY OF SOFIA   (Bulgaria)

^b UNIVERSITY OF CHEMICAL TECHNOLOGY AND METALLURGY   (Bulgaria)

^c VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

^d ALARA Engineering AB   (Sweden)

Author keywords

Kinetic model; Oxide film growth; Pressurised water reactor coolant; Stainless steel; Zinc incorporation

Indexed keywords

ANODIC OXIDATION; COOLANTS; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; FILM GROWTH; GROWTH (MATERIALS); HYDROGEN; INERT GAS WELDING; PH EFFECTS; PHOTOELECTRON SPECTROSCOPY; PRESSURIZED WATER REACTORS; SMALL NUCLEAR REACTORS; SODIUM; STAINLESS STEEL; STEEL; STEEL CORROSION; STEEL METALLURGY; WATER COOLED REACTORS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC;

AISI 316; CORROSION POTENTIALS; DEPTH COMPOSITIONS; DEPTH PROFILES; EIS AND XPS; ELECTROCHEMICAL IMPEDANCES; HYDROLYSIS REACTIONS; IN-SITU; KINETIC MODEL; MIXED CONDUCTIONS; OPEN CIRCUITS; OXIDE FILM GROWTH; OXIDE LAYER GROWTHS; OXIDE LAYERS; PARAMETER ESTIMATES; PH EXCURSIONS; PRESSURISED WATER REACTOR COOLANT; PRESSURISED WATER REACTORS; REVERSIBLE HYDROGEN ELECTRODES; TRANSPORT PARAMETERS; WITH OR WITHOUT; X-RAY PHOTOELECTRON SPECTROSCOPIES;

OXIDE FILMS;

EID: 57249089064     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2008.08.040     Document Type: Article

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