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Volumn 458, Issue 2020, 2002, Pages 823-840
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Thin films with many small cracks
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Author keywords
limit; Cracks; Homogenization; Thin films
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Indexed keywords
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EID: 57249087301
PISSN: 13645021
EISSN: None
Source Type: Journal
DOI: 10.1098/rspa.2001.0821 Document Type: Article |
Times cited : (9)
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References (10)
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