Histogram based correction of matching errors in subranged ADC

European Solid-State Circuits Conference

Volumn , Issue , 2001, Pages 555-558

  Elbornsson, J ^a   Eklund, J E ^b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b ERICSSON RESEARCH   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

MATCHING ERROR; SIGNAL QUALITY; TEST SIGNAL; UNKNOWN INPUTS;

ERRORS;

ALGORITHMS;

EID: 57149142532     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)