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Review of Scientific Instruments

Volumn 79, Issue 11, 2008, Pages

High precision differential measurement of surface photovoltage transients on ultrathin CdS layers

(4) Dittrich, Th a Bonisch S a Zabel, P a Dube, S a

a HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; SEMICONDUCTING CADMIUM COMPOUNDS; SURFACE PROPERTIES;

CDS LAYERS; CHARGE SEPARATIONS; DIFFERENTIAL MEASUREMENTS; HIGH PRECISIONS; MODEL SYSTEMS; NANOSTRUCTURED SEMICONDUCTORS; RELAXATION MECHANISMS; SURFACE PHOTO VOLTAGES; THICKNESS DEPENDENCIES; TIME-RESOLVED;

TRANSIENTS;

CADMIUM DERIVATIVE; CADMIUM SULFIDE; FLUORIDE; GLASS; SULFIDE; TIN DERIVATIVE; TIN DIOXIDE; UNCLASSIFIED DRUG;

ARTICLE; CHEMISTRY; ELECTRIC CAPACITANCE; ELECTRICITY; ELECTRODE; EQUIPMENT DESIGN; IMPEDANCE; LASER; SEMICONDUCTOR; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; TIME;

CADMIUM COMPOUNDS; ELECTRIC CAPACITANCE; ELECTRIC IMPEDANCE; ELECTRICITY; ELECTRODES; EQUIPMENT DESIGN; FLUORIDES; GLASS; LASERS; SEMICONDUCTORS; SENSITIVITY AND SPECIFICITY; SULFIDES; SURFACE PROPERTIES; TIME FACTORS; TIN COMPOUNDS;

EID: 57049137627 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3020757 Document Type: Article

Times cited : (34)

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