Similarities in the kinetics of photocrystallization and photodarkening in a-Se

Applied Physics Letters

Volumn 93, Issue 21, 2008, Pages

  Tallman, Robert E ^a   Reznik, A ^b   Weinstein, B A ^a   Baranovskii, S D ^c   Rowlands, J A ^d  

^a UNIVERSITY AT BUFFALO   (United States)

^b LAKEHEAD UNIVERSITY   (Canada)

^c PHILIPPS UNIVERSITY MARBURG   (Germany)

^d THUNDER BAY REGIONAL HEALTH SCIENCES CENTRE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHES (SNOWSLIDES); OPTOELECTRONIC DEVICES; PHOTODETECTORS; PHOTOMASKS; SNOW; SURFACE DEFECTS;

AVALANCHE PHOTODETECTORS; ENERGY SURFACES; FORMATION KINETICS; ONSET TIMES; PHOTOCRYSTALLIZATION; PHOTODARKENING; PHOTOINDUCED DEFECTS; THERMAL BEHAVIORS;

CRYSTALLIZATION KINETICS;

EID: 57049126539     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3026173     Document Type: Article

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