Axial developments of interfacial area and void concentration profiles in subcooled boiling flow of water

International Journal of Heat and Mass Transfer

Volumn 52, Issue 1-2, 2009, Pages 473-487

  Lee, Tae Ho ^a   Situ, Rong ^b   Hibiki, Takashi ^c   Park, Hyun Sik ^a   Ishii, Mamoru ^c   Mori, Michitsugu ^d  

^a Korea Atomic Energy Research Institute   (South Korea)

^b RMIT UNIVERSITY   (Australia)

^c PURDUE UNIVERSITY   (United States)

^d TOKYO ELECTRIC POWER COMPANY   (Japan)

Author keywords

Bubble layer thickness; Drift flux parameters; Interfacial area concentration; Internally heated annulus; Subcooled boiling flow; Void fraction

Indexed keywords

BOILING LIQUIDS; BOREHOLES; CHEMICAL SENSORS; FLOW OF WATER; FLUID DYNAMICS; HYDRAULICS; MULTIPHASE FLOW; THEOREM PROVING; TWO PHASE FLOW;

BUBBLE LAYER THICKNESS; DRIFT-FLUX PARAMETERS; INTERFACIAL AREA CONCENTRATION; INTERNALLY HEATED ANNULUS; SUBCOOLED BOILING FLOW;

VOID FRACTION;

EID: 56949087892     PISSN: 00179310     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijheatmasstransfer.2008.05.038     Document Type: Article

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