Characterization of prompt flash signatures using high-speed broadband diode detectors

International Journal of Impact Engineering

Volumn 35, Issue 12, 2008, Pages 1827-1835

  Thornhill, T F ^a   Reinhart, W D ^b   Chhabildas, L C ^c   Breiland, W G ^b   Alexander, C S ^b   Brown, J L ^b  

^a KTECH CORPORATION   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Aluminum; Composition B; Impact flash; Photo diode; Pyrometer

Indexed keywords

ALUMINA; DEBRIS; DIODES; ELECTROMAGNETIC WAVE EMISSION; GAS EMISSIONS; LEAKAGE (FLUID); PYROMETERS; PYROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SILICON;

COMPOSITION-B; DEBRIS CLOUDS; DIODE DETECTORS; DOMINANT MECHANISMS; HIGH IMPACTS; HYPERVELOCITY IMPACTS; HYPERVELOCITY PARTICLES; IMPACT FLASH; IMPACT SITES; IMPACT VELOCITIES; LIGHT GAS GUNS; MATERIAL BEHAVIORS; MATERIAL COMPOSITIONS; METALLIC TARGETS; MISSILE DEFENSES; NARROW BANDS; OPTICAL SIGNATURES; ORBITAL DEBRIS; ORGANIC MATERIALS; PHOTO-DIODE; RADIATING EMISSIONS; REMOTE DIAGNOSTICS; SHOCKED MATERIALS; SILICON DIODES;

SPACE DEBRIS;

EID: 56949085263     PISSN: 0734743X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijimpeng.2008.07.058     Document Type: Article

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