Modeling flow and residence time distribution in an industrial-scale reactor with a plunging jet inlet and optional agitation

Chemical Engineering Research and Design

Volumn 86, Issue 12, 2008, Pages 1462-1476

  Bai, Hua ^a   Stephenson, Amber ^a   Jimenez, Jorge ^a   Jewell, Dennis ^a   Gillis, Paul ^a  

^a DOW CHEMICAL COMPANY   (United States)

Author keywords

Agitation; CFD; Mixing; Plunging jet; Residence time distribution; RTD

Indexed keywords

COMPUTATIONAL FLUID DYNAMICS; DYNAMICS; ELECTRON TUBE DIODES; FLOW PATTERNS; FLOW SIMULATION; FLUID DYNAMICS; FORECASTING; MIXING; RANDOM PROCESSES; RESONANT TUNNELING; SEMICONDUCTOR DIODES; STEEL STRUCTURES; TEMPERATURE MEASURING INSTRUMENTS; THEOREM PROVING; TURBULENCE;

AGITATION; CFD; PLUNGING JET; RESIDENCE TIME DISTRIBUTION; RTD;

JETS;

EID: 56849117696     PISSN: 02638762     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cherd.2008.08.012     Document Type: Article

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