메뉴 건너뛰기




Volumn 47, Issue 27, 2008, Pages 4952-4958

Laser Doppler vibrometer employing active frequency feedback

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CIRCUIT OSCILLATIONS; DOPPLER EFFECT; MICHELSON INTERFEROMETERS; OSCILLISTORS; VARIABLE FREQUENCY OSCILLATORS; VIBRATION MEASUREMENT;

EID: 56849098764     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.004952     Document Type: Article
Times cited : (23)

References (19)
  • 1
    • 33750180887 scopus 로고    scopus 로고
    • Time-resolved vibration measurement with temporal speckle pattern interferometry
    • J. Kauffmann and H. J. Tiziani, "Time-resolved vibration measurement with temporal speckle pattern interferometry," Appl. Opt. 45, 6682-6688 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 6682-6688
    • Kauffmann, J.1    Tiziani, H.J.2
  • 2
    • 33746086017 scopus 로고    scopus 로고
    • Measurement of displacement and vibration by using the oblique ray method
    • D. J. Park, G. J. Park, T. S. Aum, J. H. Yi, and J. H. Kwon, "Measurement of displacement and vibration by using the oblique ray method," Appl. Opt. 45, 3728-3732 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 3728-3732
    • Park, D.J.1    Park, G.J.2    Aum, T.S.3    Yi, J.H.4    Kwon, J.H.5
  • 3
    • 33745799431 scopus 로고    scopus 로고
    • High-speed digital holographic interferometry for vibration measurement
    • G. Pedrini, W. Osten, and M. E. Gusev, "High-speed digital holographic interferometry for vibration measurement," Appl. Opt. 45, 3456-3462 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 3456-3462
    • Pedrini, G.1    Osten, W.2    Gusev, M.E.3
  • 4
    • 0016534930 scopus 로고
    • Remote vibration measurement of rough surfaces by laser interferometry
    • R. A. Bruce and G. L. Fitzpatrick, "Remote vibration measurement of rough surfaces by laser interferometry," Appl. Opt. 14, 1621-1626 (1975).
    • (1975) Appl. Opt , vol.14 , pp. 1621-1626
    • Bruce, R.A.1    Fitzpatrick, G.L.2
  • 5
    • 36549100168 scopus 로고
    • A dual resolution noncontact vibration and displacement sensor based upon a two wavelength source
    • S. C. Bartlett, F. Farahi, and D. A. Jackson, "A dual resolution noncontact vibration and displacement sensor based upon a two wavelength source," Rev. Sci. Instrum. 61, 1014-1017 (1990).
    • (1990) Rev. Sci. Instrum , vol.61 , pp. 1014-1017
    • Bartlett, S.C.1    Farahi, F.2    Jackson, D.A.3
  • 6
    • 0029196949 scopus 로고
    • Vibration transducer using an ultrashort Fabry-Perot cavity
    • N. Mio and K. Tsubono, "Vibration transducer using an ultrashort Fabry-Perot cavity," Appl. Opt. 34, 186-189 (1995).
    • (1995) Appl. Opt , vol.34 , pp. 186-189
    • Mio, N.1    Tsubono, K.2
  • 7
    • 22144469788 scopus 로고    scopus 로고
    • High-precision absolute distance and vibration measurement with frequency scanned interferometry
    • H.-J. Yang, J. Deibel, S. Nyberg, and K. Riles, "High-precision absolute distance and vibration measurement with frequency scanned interferometry," Appl. Opt. 44, 3937-3944 (2005).
    • (2005) Appl. Opt , vol.44 , pp. 3937-3944
    • Yang, H.-J.1    Deibel, J.2    Nyberg, S.3    Riles, K.4
  • 8
    • 84975577405 scopus 로고
    • Stabilized dual-wavelength fiber-optic interferometer for vibration measurement
    • O. B. Wright, "Stabilized dual-wavelength fiber-optic interferometer for vibration measurement," Opt. Lett. 16, 56-58 (1991).
    • (1991) Opt. Lett , vol.16 , pp. 56-58
    • Wright, O.B.1
  • 9
    • 0015432590 scopus 로고
    • Laser interferometer for measuring high velocities of any reflecting surface
    • L. M. Barker and R. E. Hollenbach, "Laser interferometer for measuring high velocities of any reflecting surface," J. Appl. Phys. 43, 4669-4675 (1972).
    • (1972) J. Appl. Phys , vol.43 , pp. 4669-4675
    • Barker, L.M.1    Hollenbach, R.E.2
  • 11
    • 2542548546 scopus 로고
    • Compact interferometer for accurate determination of optical constants of thin films
    • J. Shamir, "Compact interferometer for accurate determination of optical constants of thin films," J. Phys. E 9, 499-503 (1976).
    • (1976) J. Phys. E , vol.9 , pp. 499-503
    • Shamir, J.1
  • 12
    • 84893899004 scopus 로고
    • Stabilized and calibrated Michelson interferometer
    • F. P. Küpper and W. J. Mastop, "Stabilized and calibrated Michelson interferometer," Rev. Sci. Instrum. 47, 434-436 (1976).
    • (1976) Rev. Sci. Instrum , vol.47 , pp. 434-436
    • Küpper, F.P.1    Mastop, W.J.2
  • 13
    • 0015957960 scopus 로고
    • Contribution to the interferometric measurement of sub-angstrom vibrations
    • T. Kwaaitaal, "Contribution to the interferometric measurement of sub-angstrom vibrations," Rev. Sci. Instrum. 45, 39-41 (1974).
    • (1974) Rev. Sci. Instrum , vol.45 , pp. 39-41
    • Kwaaitaal, T.1
  • 14
    • 0041138890 scopus 로고
    • Two-frequency displacement measurement interferometer based on a double-heterodyne technique
    • P.-Y. Chien, "Two-frequency displacement measurement interferometer based on a double-heterodyne technique," Rev. Sci. Instrum. 62, 254-255 (1991).
    • (1991) Rev. Sci. Instrum , vol.62 , pp. 254-255
    • Chien, P.-Y.1
  • 15
    • 84893959083 scopus 로고
    • Improvement in the interferometric measurement of subangstrom vibrations
    • W. M. J. Haesen and T. Kwaaitaal, "Improvement in the interferometric measurement of subangstrom vibrations," Rev. Sci. Instrum. 44, 954-955 (1973).
    • (1973) Rev. Sci. Instrum , vol.44 , pp. 954-955
    • Haesen, W.M.J.1    Kwaaitaal, T.2
  • 17
    • 0035397369 scopus 로고    scopus 로고
    • Ultrastable laser array at 633 nm for real-time dimensional metrology
    • J. Lawall, J. M. Pedulla, and Y. L. Coq, "Ultrastable laser array at 633 nm for real-time dimensional metrology," Rev. Sci. Instrum. 72, 2879-2888 (2001).
    • (2001) Rev. Sci. Instrum , vol.72 , pp. 2879-2888
    • Lawall, J.1    Pedulla, J.M.2    Coq, Y.L.3
  • 18
    • 84893903928 scopus 로고    scopus 로고
    • Perkin Elmer Corporation, Model No. 7280, http://www.signalrecovery.com/. Certain commercial equipment, instruments, or materials are identified in this article in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.
    • Perkin Elmer Corporation, Model No. 7280, http://www.signalrecovery.com/. Certain commercial equipment, instruments, or materials are identified in this article in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.
  • 19
    • 84893915711 scopus 로고    scopus 로고
    • E. O. Brigham, The Fast Fourier Transform and its Applications (Prentice-Hall, 1988).
    • E. O. Brigham, The Fast Fourier Transform and its Applications (Prentice-Hall, 1988).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.