Quantifying software vulnerability

Conference on Computing Frontiers - Proceedings of the 2008 Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies, WREFT 2008

Volumn , Issue , 2008, Pages 323-328

  Sridharan, Vilas ^a   Kaeli, David R ^a  

^a Northeastern University   (United States)

Author keywords

Fault tolerance; Modeling; Soft errors

Indexed keywords

ARCHITECTURAL REGISTER FILES; DESIGN TRADEOFFS; FUTURE RESEARCHES; HARDWARE FAULTS; HARDWARE STRUCTURES; MODELING; PHYSICAL REGISTERS; POWERPC; RELIABILITY TECHNIQUES; SOFT ERRORS; SOFTWARE RESOURCES; SOFTWARE VULNERABILITIES;

COMPUTER SOFTWARE; ERROR CORRECTION; ERRORS; FAULT TOLERANCE; HARDWARE; RADIATION; RADIATION EFFECTS; RELIABILITY; SOFTWARE RELIABILITY; TECHNICAL PRESENTATIONS;

QUALITY ASSURANCE;

EID: 56749169880     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1366224.1366225     Document Type: Conference Paper

References (9)

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