Surface-enhanced Raman scattering at a planar dielectric interface beyond critical angle

Optics Express

Volumn 16, Issue 24, 2008, Pages 20117-20125

  Pristinski, Denis ^a,b   Le Ru, Eric C ^c   Tan, Siliu ^a   Sukhishvili, Svetlana ^a   Du, Henry ^a  

^a Stevens Institute of Technology   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT PROPAGATION; POLARIZATION; RAMAN SCATTERING; REFRACTIVE INDEX; SILVER;

DIELECTRIC INTERFACE; DIELECTRIC MEDIA; EVANESCENT EXCITATION; PLANAR BOUNDARIES; SCATTERING ANGLES; SIGNAL POLARIZATION; SILVER NANOPARTICLES; SURFACE ENHANCED RAMAN SCATTERING (SERS);

SURFACE SCATTERING;

EID: 56749151094     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.020117     Document Type: Article

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