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Volumn 37, Issue 6, 2008, Pages 625-628

GE-MXRF analysis of multilayer films

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; ION IMPLANTATION; MULTILAYER FILMS; MULTILAYERS; OPTICAL MULTILAYERS; VACUUM APPLICATIONS;

EID: 56749083219     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1108     Document Type: Article
Times cited : (6)

References (16)
  • 14
    • 85159509932 scopus 로고    scopus 로고
    • Calculations of GE-XRF Intensity
    • Calculations of GE-XRF Intensity, http://www.a-chem.eng. osaka-cu.ac.jp/tsujilab/ge-xrf/.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.