A compactness result in thin-film micromagnetics and the optimality of the Néel wall

Journal of the European Mathematical Society

Volumn 10, Issue 4, 2008, Pages 909-956

  Ignat, Radu ^a   Otto, Felix ^b  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b UNIVERSITY OF BONN   (Germany)

Author keywords

Compactness; Micromagnetics; N el wall; Principle of characteristics

Indexed keywords

EID: 56649083400     PISSN: 14359855     EISSN: None     Source Type: Journal    
DOI: 10.4171/JEMS/135     Document Type: Article

References (14)

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