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Volumn 50, Issue 3, 2008, Pages 173-183
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Electron cloud overlap related to specific energy threshold and breakdown at high temperature, short time and nano distance
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Author keywords
Electron behavior; Electron cloud; Exchange of energy; Fictitious stress and strain; High temperature; Integrity; Mechanical and thermal effects; Moderate overlap; Multiscaling; Nano distance; Short time; Specific energy; Threshold; Uncertainty
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Indexed keywords
ADMINISTRATIVE DATA PROCESSING;
ATOMIC PHYSICS;
ATOMS;
QUALITY ASSURANCE;
STRESSES;
THERMOGRAPHY (TEMPERATURE MEASUREMENT);
ELECTRON BEHAVIOR;
ELECTRON CLOUD;
EXCHANGE OF ENERGY;
FICTITIOUS STRESS AND STRAIN;
HIGH TEMPERATURE;
INTEGRITY;
MECHANICAL AND THERMAL EFFECTS;
MODERATE OVERLAP;
MULTISCALING;
NANO DISTANCE;
SHORT TIME;
SPECIFIC ENERGY;
THRESHOLD;
UNCERTAINTY;
ELECTRONS;
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EID: 56549117843
PISSN: 01678442
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tafmec.2008.07.015 Document Type: Article |
Times cited : (7)
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References (15)
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