X-ray powder diffraction quantitative analysis of an amorphous SiO 2-poly(methyl methacrylate) nanocomposite

Journal of Applied Crystallography

Volumn 41, Issue 6, 2008, Pages 985-990

  Riello, P ^a,b   Munarin, M ^a   Silvestrini, S ^a   Moretti, E ^a,b   Storaro, L ^a,b  

^a CA' FOSCARI UNIVERSITY OF VENICE   (Italy)

^b INSTM UdR Venezia   (Italy)

Author keywords

Amorphous materials; Nanocomposite materials; Quantitative analysis; X ray powder diffraction

Indexed keywords

EID: 56549103876     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808029944     Document Type: Article

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