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Volumn 89, Issue 1-4, 2008, Pages 65-70

Direct measurement of particle-bubble interaction forces using atomic force microscopy

Author keywords

Atomic force microscopy; Particle bubble interactions; Silica; Surface element integration; Surface potential

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CURVE FITTING; DEIONIZED WATER; FLOW INTERACTIONS; FLUID DYNAMICS; MICROSCOPIC EXAMINATION; OXIDES; SCANNING PROBE MICROSCOPY; SILICA; SURFACE POTENTIAL; SURFACE PROPERTIES;

EID: 56549092397     PISSN: 03017516     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.minpro.2008.09.005     Document Type: Article
Times cited : (51)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.