Formal modeling and analysis of a flash filesystem in Alloy

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 5238 LNCS, Issue , 2008, Pages 294-308

  Kang, Eunsuk ^a   Jackson, Daniel ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSTRACTING; CERIUM ALLOYS; FAULT TOLERANCE; INTRUSION DETECTION; MODEL CHECKING; QUALITY ASSURANCE; RELIABILITY; TRACE ELEMENTS;

BASIC OPERATIONS; DATA ELEMENTS; FILESYSTEM MODELS; MODELING AND ANALYSIS; NAND FLASHES; POWER LOSSES; TRACE INCLUSIONS;

TRACE ANALYSIS;

EID: 56549084060     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-87603-8_23     Document Type: Conference Paper

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