TOF-SIMS study of red sealing-inks on paper and its forensic applications

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1523-1526

  Lee, Jihye ^a   Lee, Chiwoo ^a   Lee, Kangbong ^b   Lee, Yeonhee ^b  

^a Korea University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

Forensic science; Questioned document; Sealing inks; TOF SIMS

Indexed keywords

FORENSIC SCIENCE; ORGANIC POLYMERS; PAPER;

FORENSIC APPLICATIONS; FORENSIC LABORATORY; LEGAL PROCEEDINGS; NON-DESTRUCTIVE ANALYSIS; QUESTIONED DOCUMENTS; SEALING-INKS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

SECONDARY ION MASS SPECTROMETRY;

EID: 56449124740     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.094     Document Type: Article

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