SCOPUS 정보 검색 플랫폼

Pramana - Journal of Physics

Volumn 71, Issue 5, 2008, Pages 1123-1127

Magnetization in permalloy thin films

(3) Gupta, Rachana a Gupta, Mukul b Gutberlet, Thomas c

a Science and Commerce (India)

b DEPARTMENT OF ATOMIC ENERGY (India)

c ETH ZURICH (Switzerland)

Author keywords

NiFe nitrides; NiFe thin films; Permalloy; Polarized neutron reflectometry

Indexed keywords

ARGON; ELECTROMAGNETIC WAVES; GASES; IRON COMPOUNDS; MAGNETIC MOMENTS; MAGNETRON SPUTTERING; NITRIDES; NITROGEN; REFLECTION; SPIN DYNAMICS; THICK FILMS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

AMBIENT TEMPERATURES; COERCIVITY; NIFE NITRIDES; NIFE THIN FILMS; NITROGEN PARTIAL PRESSURES; PERMALLOY; PERMALLOY THIN FILMS; POLARIZED NEUTRON REFLECTIVITY MEASUREMENTS; POLARIZED NEUTRON REFLECTOMETRY; X-RAY DIFFRACTIONS; XRD PATTERNS;

FILM PREPARATION;

EID: 56449120320 PISSN: 03044289 EISSN: None Source Type: Journal
DOI: 10.1007/s12043-008-0234-6 Document Type: Conference Paper

Times cited : (12)

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