Bayesian multiple instance learning: Automatic feature selection and inductive transfer

Proceedings of the 25th International Conference on Machine Learning

Volumn , Issue , 2008, Pages 808-815

  Raykar, Vikas C ^a   Krishnapuram, Balaji ^a   Bi, Jinbo ^a   Dundar, Murat ^a   Rao, R Bharat ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAYESIAN NETWORKS; CLASSIFIERS; EDUCATION; LEARNING SYSTEMS; ROBOT LEARNING;

AUTOMATIC FEATURE SELECTIONS; BAYESIAN; FEATURE SUBSETS; INDUCTIVE TRANSFERS; MULTIPLE INSTANCE LEARNINGS; MULTIPLE-INSTANCE LEARNING;

LEARNING ALGORITHMS;

EID: 56449092895     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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