Analysis on Cu0.95Mn0.05O for ferromagnetic ordering

Materials Chemistry and Physics

Volumn 113, Issue 1, 2009, Pages 67-70

  Raja, S Philip ^a   Joseph, D Paul ^a   Venkateswaran, C ^a  

^a UNIVERSITY OF MADRAS   (India)

Author keywords

Chemical synthesis; Magnetic properties; Oxides; Rietveld analysis

Indexed keywords

CHEMICAL PROPERTIES; COPPER; COPPER OXIDES; ELECTRIC CONDUCTIVITY; FERROMAGNETIC MATERIALS; FERROMAGNETISM; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MANGANESE; MANGANESE ALLOYS; MANGANESE COMPOUNDS; METAL IONS; MICROSCOPIC EXAMINATION; PRECIPITATION (CHEMICAL); RIETVELD METHOD; SEMICONDUCTOR MATERIALS; SYNTHESIS (CHEMICAL); THERMOANALYSIS; TRANSITION METAL COMPOUNDS; TRANSITION METALS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

BAND GAPS; CHEMICAL SYNTHESIS; DOPED OXIDES; ENERGY DISPERSIVE; FERROMAGNETIC BEHAVIORS; FERROMAGNETIC ORDERINGS; MAGNETIC MEASUREMENTS; PRECIPITATION METHODS; RAY ANALYSES; SEMI-CONDUCTORS; SPINTRONICS; TRANSITION METAL IONS; VIBRATING SAMPLES; X-RAY DIFFRACTIONS;

RIETVELD ANALYSIS;

EID: 56449091788     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.07.028     Document Type: Article

References (24)

1. Ohno H. Science 281 (1998) 951-956
2. Janisch R., Gopal P., and Spaldin N.A. J. Phys.: Condens. Matter 17 (2005) R657-R689
3. Prellier W., Fouchet A., and Mercey B. J. Phys.: Condens. Matter 15 (2003) R1583-R1601
4. Pearton S.J., Abernathy C.R., Norton D.P., Hebard A.F., Park Y.D., Boatner L.A., and Budai J.D. Mater. Sci. Eng. R40 (2003) 137-168
5. Katayama-Yoshida H., and Sato K. Physica B 327 (2003) 337-343
6. Paul Joseph D., Senthil Kumar G., and Venkateswaran C. Mater. Lett. 59 (2005) 2720-2724
7. Matsumoto Y., Murakami M., Shono T., Hasegawa T., Fukumura T., Kawasaki M., Ahmet P., Chikyow T., Koshihara S.-y., and Koinuma H. Science 291 (2001) 854
8. Ueda K., Tabata H., and Kawai T. Appl. Phys. Lett. 79 (2001) 988
9. Ogale S.B., Choudhary R.J., Buban J.P., Lofland S.E., Shinde S.R., Kale S.N., Kulkarni V.N., Higgins J., Lanci C., Simpson J.R., Browning N.D., Das Sarma S., Drew H.D., Greene R.L., and Venkatesan T. Phys. Rev. Lett. 91 (2003) 077205
10. Fukumura T., Yamada Y., Toyosaki H., Hasegawa T., Koinuma H., and Kawasaki M. Appl. Surf. Sci. 223 1-3 (2004) 62-65
11. Pan L., Zhu H., Fan C., Wang W., Zhang Y., and Xiao J.Q. J. Appl. Phys. 97 (2005) 10D318
12. Borzi R.A., Stewart S.J., Punte G., Mercader R.C., Curctchet G.A., Zysler R.D., and Tovar M. J. Appl. Phys. 87 9 (2000) 4870-4872
13. Yang S.G., Li T., Gu B.X., and Du Y.W. Appl. Phys. Lett. 83 November (18) (2003) 3746-3748
14. Ivill M., Overberg M.E., Abernathy C.R., Norton D.P., Hebard A.F., Theodoropoulou N., and Budai J.D. Solid-State Electron. 47 (2003) 2215-2220
15. Zhu H., Zhao F., Pan L., Zhang Y., Fan C., Zhang Y., and Xiao J.Q. J. Appl. Phys. 101 (2007) 09H111
16. 2O. Mater. Charact. 59 8 (2008) 1137-1139
17. Rakhshani A.E. Solid-State Electron. 29 (1986) 7
18. Loram J.W., Mirza K.A., Joyce C.P., and Osberne A.J. Europhys. Lett. 8 (1989) 263
19. L. Lutterrotti, MAUD materials analysis using diffraction version: 2.064, 2008, http://www.ing.unitn.it/∼maud/.
20. Wei J., Nagarajan N., and Zhitomirsky I. J. Mater. Process. Technol. 186 (2007) 356-361
21. Nagarajan N., Cheong M., and Zhitomirsky I. Mater. Chem. Phys. 103 1 (2007) 47-53
22. Griffin K.A., Pakhomov A.B., Wang C.M., Heald S.M., and Krishnan K.M. Phys. Rev. Lett. 94 (2005) 157204
23. Kennett M.P., Berciu M., and Bhatt R.N. Phys. Rev. B 66 (2002) 045207
24. Arbuzova T.I., Samokhvalov A.A., Smolyak I.B., Karpenko B.V., Chebotaev N.M., and Naumov S.V. J. Magn. Magn. Mater. 95 (1991) 168