Second generation of correction methods in electron probe X-ray microanalysis: Approximation models for emission depth distribution functions

Zhurnal Analiticheskoj Khimii

Volumn 59, Issue 7, 2004, Pages 678-696

  Lavrent'ev, Yu G ^a   Korolyuk, V N ^a   Usova, L V ^a  

^a NONE

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EID: 5644286452     PISSN: 00444502     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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