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Volumn 69, Issue 17, 1996, Pages 2554-2556
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Interface roughness and alloy-disorder scattering contributions to intersubband transition linewidths
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 5644250816
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117737 Document Type: Article |
Times cited : (127)
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References (7)
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