Quantification of skin wrinkles using low coherence interferometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5316, Issue , 2004, Pages 463-466

  Oh, Jung Taek ^a   Kim, Beop Min ^a   Son, Sang Ryoon ^a   Lee, Sang Won ^a   Kim, Dong Yoon ^a   Kim, Youn Soo ^b  

^a Yonsei University Wonju   (South Korea)

^b Chungnam National University   (South Korea)

Author keywords

Cosmeceutics; Low coherence interferometry; Skin topology

Indexed keywords

BACKSCATTERING; BIOMEDICAL ENGINEERING; COHERENT LIGHT; FAST FOURIER TRANSFORMS; OPTICAL RESOLVING POWER; PATIENT TREATMENT; SCANNING; SILICON; SKIN; TOMOGRAPHY;

COSMECEUTICS; LOW COHERENCE INTERFEROMETER (LCI); RAPID SCANNING DELAY LINE (RSOD); SKIN TOPOLOGY;

INTERFEROMETRY;

EID: 5644250744     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.528716     Document Type: Conference Paper

References (6)

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