-
3
-
-
0000774863
-
Evaluation of non-normal process capability indices using Burr's distributions
-
Castagliola P. Evaluation of non-normal process capability indices using Burr's distributions. Quality Engineering 8 4 (1996) 587-593
-
(1996)
Quality Engineering
, vol.8
, Issue.4
, pp. 587-593
-
-
Castagliola, P.1
-
4
-
-
0033131670
-
A two-stage network approach for process variance change detection and classification
-
Chang S.I., and Ho E.S. A two-stage network approach for process variance change detection and classification. International Journal of Production Research 37 (1999) 1581-1599
-
(1999)
International Journal of Production Research
, vol.37
, pp. 1581-1599
-
-
Chang, S.I.1
Ho, E.S.2
-
5
-
-
0030361221
-
An asymptotic distribution of Wright's process capability index sensitive to skewness
-
Chen H.F., and Kotz S. An asymptotic distribution of Wright's process capability index sensitive to skewness. Journal of Statistical Computation and Simulation 55 (1996) 147-158
-
(1996)
Journal of Statistical Computation and Simulation
, vol.55
, pp. 147-158
-
-
Chen, H.F.1
Kotz, S.2
-
6
-
-
0003168393
-
Process capability calculations for non-normal distributions
-
Clements J.A. Process capability calculations for non-normal distributions. Quality Progress 22 (1989) 95-100
-
(1989)
Quality Progress
, vol.22
, pp. 95-100
-
-
Clements, J.A.1
-
8
-
-
0026898532
-
Identification of change structure in statistical process control
-
Guo Y., and Dooley K.J. Identification of change structure in statistical process control. International Journal of Production Research 30 (1992) 1655-1669
-
(1992)
International Journal of Production Research
, vol.30
, pp. 1655-1669
-
-
Guo, Y.1
Dooley, K.J.2
-
9
-
-
0003450273
-
-
Applied Computer Solutions, Inc, St. Clair Shores, Michigan
-
Gruska G.F., Mirkhani K., and Lamberson L.R. Non-normal data analysis (1989), Applied Computer Solutions, Inc, St. Clair Shores, Michigan
-
(1989)
Non-normal data analysis
-
-
Gruska, G.F.1
Mirkhani, K.2
Lamberson, L.R.3
-
11
-
-
0027589082
-
X-bar control chart pattern identification through efficient off-line neural network training
-
Hwarng H.B., and Hubele N.F. X-bar control chart pattern identification through efficient off-line neural network training. IIE Transactions 25 (1993) 27-40
-
(1993)
IIE Transactions
, vol.25
, pp. 27-40
-
-
Hwarng, H.B.1
Hubele, N.F.2
-
12
-
-
39049139625
-
System of frequency curves generated by methods of translation
-
Johnson N.L. System of frequency curves generated by methods of translation. Biometrika 36 (1949) 149-176
-
(1949)
Biometrika
, vol.36
, pp. 149-176
-
-
Johnson, N.L.1
-
13
-
-
0003070321
-
Process capability indices
-
Kane V.E. Process capability indices. Journal of Quality Technology 18 1 (1986) 41-52
-
(1986)
Journal of Quality Technology
, vol.18
, Issue.1
, pp. 41-52
-
-
Kane, V.E.1
-
14
-
-
31844435263
-
Process capability analysis of non-normal process data using the Burr XII distribution
-
Liu P.H., and Chen F.L. Process capability analysis of non-normal process data using the Burr XII distribution. International Journal of Advanced Manufacturing Technology 27 (2006) 975-984
-
(2006)
International Journal of Advanced Manufacturing Technology
, vol.27
, pp. 975-984
-
-
Liu, P.H.1
Chen, F.L.2
-
15
-
-
0029233298
-
Multivariate statistics and neural networks in process fault detection
-
Martin E.B., and Morris A.J. Multivariate statistics and neural networks in process fault detection. IEE-Colloquium-(Digest) 79 (1995) 1-8
-
(1995)
IEE-Colloquium-(Digest)
, vol.79
, pp. 1-8
-
-
Martin, E.B.1
Morris, A.J.2
-
16
-
-
28844486614
-
Fault diagnosis in multivariate control charts using artificial neural networks
-
Niaki S.T.A., and Abbasi B. Fault diagnosis in multivariate control charts using artificial neural networks. Quality & Reliability Engineering International 21 (2005) 825-840
-
(2005)
Quality & Reliability Engineering International
, vol.21
, pp. 825-840
-
-
Niaki, S.T.A.1
Abbasi, B.2
-
19
-
-
20644434471
-
A generalization of Clements' method for non-normal Pearsonian processes with asymmetric tolerances
-
Pearn W.L., Chen K.S., and Lin G.H. A generalization of Clements' method for non-normal Pearsonian processes with asymmetric tolerances. International Journal of Quality & Reliability Management 16 5 (1999) 507-521
-
(1999)
International Journal of Quality & Reliability Management
, vol.16
, Issue.5
, pp. 507-521
-
-
Pearn, W.L.1
Chen, K.S.2
Lin, G.H.3
-
20
-
-
0001546022
-
Application of Clements' method for calculating second and third generation process capability indices for non-normal Pearsonian populations
-
Pearn W.L., and Kotz S. Application of Clements' method for calculating second and third generation process capability indices for non-normal Pearsonian populations. Quality Engineering 7 1 (1994) 139-145
-
(1994)
Quality Engineering
, vol.7
, Issue.1
, pp. 139-145
-
-
Pearn, W.L.1
Kotz, S.2
-
21
-
-
0024943235
-
Synthetic neural networks for process control
-
Pugh G.A. Synthetic neural networks for process control. Computers and Industrial Engineering 17 (1989) 24-26
-
(1989)
Computers and Industrial Engineering
, vol.17
, pp. 24-26
-
-
Pugh, G.A.1
-
24
-
-
0003444646
-
-
PDP Research Group, MIT Press, MA, Cambridge
-
Rumelhart D.E., McClelland J.L., and PDP Research Group. Parallel distributed processing: Explorations in the microstructure of cognition (1986), MIT Press, MA, Cambridge
-
(1986)
Parallel distributed processing: Explorations in the microstructure of cognition
-
-
Rumelhart, D.E.1
McClelland, J.L.2
-
25
-
-
0000687864
-
Process capability indices and non-normal distributions
-
Somerville S., and Montgomery D. Process capability indices and non-normal distributions. Quality Engineering 19 2 (1996) 305-316
-
(1996)
Quality Engineering
, vol.19
, Issue.2
, pp. 305-316
-
-
Somerville, S.1
Montgomery, D.2
-
26
-
-
0030106841
-
The maximum likelihood estimation of the Burr XII parameters with censored and uncensored data
-
Wang F.K., Kents J.B., and Zimmer W.J. The maximum likelihood estimation of the Burr XII parameters with censored and uncensored data. Microelectronics and Reliability 36 (1996) 359-362
-
(1996)
Microelectronics and Reliability
, vol.36
, pp. 359-362
-
-
Wang, F.K.1
Kents, J.B.2
Zimmer, W.J.3
-
28
-
-
56349158951
-
-
Wu, H. H, Wang, J. S., & Liu, T. L. (1998). Discussions of the Clements-based process capability indices. In Proceedings of the CIIE national conference (pp. 561-566).
-
Wu, H. H, Wang, J. S., & Liu, T. L. (1998). Discussions of the Clements-based process capability indices. In Proceedings of the CIIE national conference (pp. 561-566).
-
-
-
|