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Volumn , Issue , 2008, Pages 200-206
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Framework for management of replicated IEC 61499 applications
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTROL APPLICATIONS;
DISTRIBUTED CONTROLS;
FUNCTION BLOCKS;
IEC 61499 STANDARDS;
MANAGEMENT FRAMEWORKS;
FACTORY AUTOMATION;
SEMICONDUCTOR QUANTUM DOTS;
SYSTEMS ANALYSIS;
APPLICATIONS;
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EID: 56349124707
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ETFA.2008.4638393 Document Type: Conference Paper |
Times cited : (6)
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References (9)
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