Fractal characteristics investigation on electromagnetic scattering from 2-D Weierstrass fractal dielectric rough surface

Chinese Physics B

Volumn 17, Issue 8, 2008, Pages 2956-2962

  Ren, Xin Cheng ^a,b   Guo, Li Xin ^a  

^a XIDIAN UNIVERSITY   (China)

^b YAN'AN UNIVERSITY   (China)

Author keywords

2 D band limited Weierstrass fractal function; Dielectric rough surface; Fractal characteristics; Kirchhoff approximation

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC NETWORK ANALYSIS; FRACTALS; INVERSE PROBLEMS; LINEAR EQUATIONS; NUMERICAL ANALYSIS; POLYNOMIAL APPROXIMATION; PROBABILITY DENSITY FUNCTION; REMOTE SENSING; SCATTERING; SPACE OPTICS; SURFACE MEASUREMENT;

2-D BAND-LIMITED WEIERSTRASS FRACTAL FUNCTION; ANALYTIC SOLUTIONS; DIELECTRIC ROUGH SURFACE; DIELECTRIC ROUGH SURFACES; ELECTROMAGNETIC SCATTERINGS; FRACTAL CHARACTERISTICS; FRACTAL FUNCTIONS; KIRCHHOFF APPROXIMATION; KIRCHHOFF APPROXIMATIONS; NUMERICAL CALCULATIONS; ROUGH SURFACES; SCATTERED FIELDS; SCATTERING INTENSITIES; SCATTERING PATTERNS; THEORETICAL ANALYSES;

TWO DIMENSIONAL;

EID: 56349100253     PISSN: 16741056     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-1056/17/8/032     Document Type: Article

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