Non-destructive visualization of defect borders in flawed plates inspected by thermal load

Journal of Physics D: Applied Physics

Volumn 41, Issue 20, 2008, Pages

  Dolinko, A E ^a,b  

^a INSTITUTO DE FÍSICA ROSARIO   (Argentina)

^b UNIVERSIDAD NACIONAL DE ROSARIO   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

REMOTE SENSING; THERMAL LOAD; THERMOANALYSIS;

DEFECT CHARACTERIZATIONS; EXPERIMENTAL DATUMS; INFRARED THERMOGRAPHIES; OPTICAL INTERFEROMETRIC TECHNIQUES; POST-PROCESSING; SHAPE AND SIZES; TEMPERATURE PROFILES;

DEFECTS;

EID: 56349090154     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/20/205503     Document Type: Article

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