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Volumn 7042, Issue , 2008, Pages

Metrology at the nanoscale: What are the grand challenges?

Author keywords

Information management; Information technologies; Instrumentation; Integration; Interoperability; IT; Nanomanufacturing; Nanometrology; Standards

Indexed keywords

INDUSTRIAL RESEARCH; INFORMATION MANAGEMENT; INSTRUMENTS; MANAGEMENT INFORMATION SYSTEMS; NANOTECHNOLOGY; STANDARDS; TECHNICAL PRESENTATIONS; THREE DIMENSIONAL;

EID: 56249138278     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.798004     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 1
    • 56249093947 scopus 로고    scopus 로고
    • National Nanotechnology Initiative NNI
    • National Nanotechnology Initiative (NNI) www.nano.gov
  • 2
    • 56249118492 scopus 로고    scopus 로고
    • Manufacturing the Future, Report of the Interagency Working Group on Manufacturing Research and Development (R&D), Committee on Technology, National Science and Technology Council (NSTC), April 2008
    • Manufacturing the Future, Report of the Interagency Working Group on Manufacturing Research and Development (R&D), Committee on Technology, National Science and Technology Council (NSTC), April 2008
  • 3
    • 56249128008 scopus 로고    scopus 로고
    • Manufacturing at the Nanoscale, Report of the National Nanotechnology Initiative Workshops 2002-2004, http://www.nano.gov/html/res/pubs.html
    • Manufacturing at the Nanoscale, Report of the National Nanotechnology Initiative Workshops 2002-2004, http://www.nano.gov/html/res/pubs.html
  • 4
    • 56249117808 scopus 로고    scopus 로고
    • NIST Manufacturing Engineering Laboratory
    • NIST Manufacturing Engineering Laboratory, Nanomanufacturing Program (http://www.mel.nist.gov/proj/nm.htm)
    • Nanomanufacturing Program
  • 5
    • 42149157237 scopus 로고    scopus 로고
    • Instrumentation and Metrology for Nanotechnology
    • January 27-29, Gaithersburg, MD
    • Instrumentation and Metrology for Nanotechnology, Report of the National Nanotechnology Initiative Workshop, January 27-29, 2004, NIST - Gaithersburg, MD, http://www.nano.gov/NNI_Instrumentation_Metrology_rpt.pdf
    • (2004) Report of the National Nanotechnology Initiative Workshop
  • 6
    • 56249141590 scopus 로고    scopus 로고
    • Instrumentation, Metrology, and Standards for Nanomanufacturing Workshop, October 17-19, 2006, National Science and Technology Council (NSTC), Interagency Working Group (IWG) on Manufacturing Research and Development (R&D), NIST, NSF, and ONR sponsorship, Gaithersburg, MD [to be published 4Q2008]
    • Instrumentation, Metrology, and Standards for Nanomanufacturing Workshop, October 17-19, 2006, National Science and Technology Council (NSTC), Interagency Working Group (IWG) on Manufacturing Research and Development (R&D), NIST, NSF, and ONR sponsorship, Gaithersburg, MD [to be published 4Q2008]
  • 7
    • 56249126104 scopus 로고    scopus 로고
    • Wikipedia Foundation, Inc
    • Wikipedia Foundation, Inc., http://en.wikipedia.org/wiki/ Information_management


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.