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Volumn 7042, Issue , 2008, Pages
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Metrology at the nanoscale: What are the grand challenges?
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Author keywords
Information management; Information technologies; Instrumentation; Integration; Interoperability; IT; Nanomanufacturing; Nanometrology; Standards
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Indexed keywords
INDUSTRIAL RESEARCH;
INFORMATION MANAGEMENT;
INSTRUMENTS;
MANAGEMENT INFORMATION SYSTEMS;
NANOTECHNOLOGY;
STANDARDS;
TECHNICAL PRESENTATIONS;
THREE DIMENSIONAL;
DIMENSIONAL METROLOGIES;
GRAND CHALLENGES;
INSTRUMENTATION;
INTEGRATED MANUFACTURING;
IT;
MANUFACTURED PRODUCTS;
MEASUREMENT METHODS;
NANO METROLOGIES;
NANOMANUFACTURING;
NANOMETER SCALES;
NANOMETROLOGY;
NANOSCALE;
NATIONAL NANOTECHNOLOGY INITIATIVES;
PROCESS APPLICATIONS;
PRODUCT PERFORMANCES;
PRODUCT REALIZATIONS;
RESEARCH DIRECTIONS;
SCALE-UP;
SYSTEMS APPROACHES;
MEASUREMENTS;
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EID: 56249138278
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.798004 Document Type: Conference Paper |
Times cited : (5)
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References (7)
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