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Volumn 7078, Issue , 2008, Pages

Compensation of mechanical inaccuracies in micro-CT and nano-CT

Author keywords

Mechanical accuracy; Micro CT; Nano CT; Spot movement; Thermal expansion; Tomography

Indexed keywords

COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC RADIOGRAPHY; ELECTRIC INSTRUMENT TRANSFORMERS; IMAGE QUALITY; IMAGING SYSTEMS; MEDICAL IMAGING; SCANNING; SHRINKAGE; STEREO VISION; THERMAL SPRAYING; THERMAL STRESS; TOMOGRAPHY; VEGETATION; VIBRATIONS (MECHANICAL);

EID: 56249128240     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.793212     Document Type: Conference Paper
Times cited : (47)

References (9)
  • 1
    • 56249140208 scopus 로고    scopus 로고
    • Sasov A., Verelst K., Nadeem F., Adaptive acquisition geometry for micro-CT with large-format detectors, accepted for Developments in X-ray Tomography VI, San Diego (2008).
    • Sasov A., Verelst K., Nadeem F., "Adaptive acquisition geometry for micro-CT with large-format detectors," accepted for "Developments in X-ray Tomography VI", San Diego (2008).
  • 2
    • 0035762271 scopus 로고    scopus 로고
    • Desktop x-ray micro-CT instruments
    • Developments in X-Ray Tomography III. Edited by Bonse, Ulrich
    • Sasov A., "Desktop x-ray micro-CT instruments," Developments in X-Ray Tomography III. Edited by Bonse, Ulrich. Proceedings of the SPIE, Volume 4503, pp. 282-290 (2002).
    • (2002) Proceedings of the SPIE , vol.4503 , pp. 282-290
    • Sasov, A.1
  • 4
    • 15844384464 scopus 로고    scopus 로고
    • Sasov A., X-ray nanotomography, Developments in X-Ray Tomography IV. Edited by Bonse, Ulrich. Proceedings of the SPIE, 5535, pp. 201-211 (2004).
    • Sasov A., "X-ray nanotomography," Developments in X-Ray Tomography IV. Edited by Bonse, Ulrich. Proceedings of the SPIE, Volume 5535, pp. 201-211 (2004).
  • 5
    • 56249142428 scopus 로고    scopus 로고
    • Sasov A., Non-destructive 3D imaging of the objects internal microstructure by microCT attachment for SEM, Accepted abstract for European Microscopic Congress in Aachen, Sep., 2008.
    • Sasov A., " Non-destructive 3D imaging of the objects internal microstructure by microCT attachment for SEM," Accepted abstract for European Microscopic Congress in Aachen, Sep., 2008.
  • 7
    • 36549045130 scopus 로고    scopus 로고
    • Software image alignment for X-ray microtomography with submicrometre resolution using a SEM-based X-ray microscope
    • December, pp, 2007
    • Mayo, S., Miller, P., Gao, D., Sheffield-Parker, J., "Software image alignment for X-ray microtomography with submicrometre resolution using a SEM-based X-ray microscope," Journal of Microscopy, Volume 228, Number 3, December, pp. 257-263 (2007).
    • Journal of Microscopy , vol.228 , Issue.3 , pp. 257-263
    • Mayo, S.1    Miller, P.2    Gao, D.3    Sheffield-Parker, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.