18O2 isotope labeling studies of stress effect on oxidation kinetics

Journal of Applied Physics

Volumn 83, Issue 7, 1998, Pages 3849-3855

  Imai, Keitaro ^a,c   Yamabe, Kikuo ^b  

^a TOSHIBA CORPORATION   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 56249096543     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366616     Document Type: Article

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