Probability coverage and interval length for Welch's and Yuen's techniques: Shift in location, change in scale, and (Un)equal sizes

Journal of Modern Applied Statistical Methods

Volumn 6, Issue 2, 2007, Pages 421-442

  Jonathan Mends Cole, S ^a  

^a WALDEN UNIVERSITY   (United States)

Author keywords

Confidence interval; Interval length; Monte Carlo simulation; Probability coverage; Welch's procedure; Yuen's procedure

Indexed keywords

EID: 56249089697     PISSN: 15389472     EISSN: 15389472     Source Type: Journal    
DOI: 10.22237/jmasm/1193890020     Document Type: Article

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