Statistical data analysis of thin film photovoltaic modules deployed in hot and humid climate of Florida

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7048, Issue , 2008, Pages

  Pethe, Shirish A ^a   Kaul, Ashwani ^a   Dhere, Neelkanth G ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

a Si:H; High voltage bias; PVUSA type regression

Indexed keywords

DC GENERATORS; DEGRADATION; ELECTRICITY; ENERGY CONVERSION; LEAKAGE CURRENTS; PAPER SHEETING; PHOTOELECTRIC CELLS; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; PHOTOVOLTAIC EFFECTS; REGRESSION ANALYSIS; RELIABILITY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; THICK FILMS; THIN FILM DEVICES; THIN FILMS;

A-SI:H; ACCELERATED TESTS; CONTINUOUS DATUMS; FLORIDA; HIGH VOLTAGE BIAS; HIGH VOLTAGES; HOT AND HUMID CLIMATES; INFANT MORTALITIES; METEOROLOGICAL PARAMETERS; PERFORMANCE ANALYSES; PHOTOVOLTAIC MODULES; PV MODULES; PV PERFORMANCES; PVUSA TYPE REGRESSION; STATISTICAL DATA ANALYSES; THIN FILM PHOTOVOLTAIC MODULES; USEFUL LIFETIMES;

DATA ACQUISITION;

EID: 56249086098     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.795009     Document Type: Conference Paper

References (9)

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