Random test run length and effectiveness

ASE 2008 - 23rd IEEE/ACM International Conference on Automated Software Engineering, Proceedings

Volumn , Issue , 2008, Pages 19-28

  Andrews, James H ^a   Grocer, Alex ^b   Weston, Melissa ^a   Xu, Ru Gang ^c  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c Engineering IV   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLIGHT SOFTWARES; LARGE SCALE CASE STUDIES; PROBABILITY OF FAILURES; RANDOM TESTING; RANDOM TESTS; SHORT RUNS; SIMPLE MODELS; TEST LENGTHS; TEST RUNS;

AUTOMATION; RANDOM PROCESSES; SAFETY ENGINEERING; SOFTWARE ENGINEERING;

SOFTWARE TESTING;

EID: 56249084282     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASE.2008.12     Document Type: Conference Paper

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