FiD: A software for ab initio structural identification of product ions from tandem mass spectrometric data

Rapid Communications in Mass Spectrometry

Volumn 22, Issue 19, 2008, Pages 3043-3052

  Heinonen, Markus ^a   Rantanen, Ari ^a,b   Mielikäinen, Taneli ^c   Kokkonen, Juha ^d   Kiuru, Jari ^d   Ketola, Raimo A ^a   Rousu, Juho ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

^b ETH ZURICH   (Switzerland)

^c NOKIA RESEARCH CENTER   (United States)

^d VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

MASS SPECTROMETERS; NEGATIVE IONS; STRUCTURAL ANALYSIS; SUGARS;

AB INITIO; FRAGMENTATION PATHWAYS; IDENTIFICATION OF PRODUCTS; MASS SPECTROMETRIC DATA; PRODUCT IONS; SOFTWARE-TOOLS; SPECTROMETRIC MEASUREMENTS; STEP MODELS; STRUCTURAL IDENTIFICATION; TANDEM MASS SPECTROMETRIC;

MASS SPECTROMETRY;

ION;

ALGORITHM; ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER PROGRAM; COMPUTER SIMULATION; ELECTROSPRAY MASS SPECTROMETRY; EVALUATION; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; COMPUTER SIMULATION; IONS; MODELS, CHEMICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SOFTWARE; SPECTROMETRY, MASS, ELECTROSPRAY IONIZATION;

EID: 56149101337     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.3701     Document Type: Article

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