Modelling of penetration of ions through a shutter grid in ion mobility spectrometers

Sensors and Actuators, B: Chemical

Volumn 135, Issue 1, 2008, Pages 116-121

  Puton, Jarosław ^a   Knap, Andrzej ^a   Siodłowski, Bogusław ^a  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Computer simulation of ions movement; Ion mobility spectrometry (IMS); Ion shutter

Indexed keywords

COMPUTATIONAL METHODS; CONCENTRATION (PROCESS); ELECTRIC FIELDS; ELECTROLYSIS; PARTICLE SPECTROMETERS; SPECTROMETERS; SPECTROMETRY;

COMPUTER CALCULATIONS; GRID ELECTRODES; IN DEPENDENCES; ION CONCENTRATIONS; ION MOBILITY SPECTROMETERS; ION MOBILITY SPECTROMETRY (IMS); NEIGHBOURHOOD; RESOLVING POWERS;

IONS;

EID: 56049113459     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2008.08.011     Document Type: Article

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