A fast form approach to measuring technology acceptance and other constructs

MIS Quarterly: Management Information Systems

Volumn 32, Issue 4, 2008, Pages 687-703

  Chin, Wynne W ^a   Johnson, Norman ^a   Schwarz, Andrew ^b  

^a UNIVERSITY OF HOUSTON   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

Item decomposition; Nomological validity; Scale development; Semantic differential; Technology acceptance

Indexed keywords

EFFICIENCY; SEMANTICS;

COMPLETION TIME; MEASURING TECHNOLOGY; NOMOLOGICAL VALIDITY; SCALE DEVELOPMENT; SEMANTIC DIFFERENTIAL; SEMANTIC DIFFERENTIAL SCALE; TECHNOLOGY ACCEPTANCE; TECHNOLOGY ACCEPTANCE MODEL;

SURVEYS;

EID: 55949130648     PISSN: 02767783     EISSN: None     Source Type: Journal    
DOI: 10.2307/25148867     Document Type: Article

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