TEM observation of liquid phase sintering in V2O5 modified Zr0.8Sn0.2TiO4 microwave ceramics

Ceramics International

Volumn 35, Issue 1, 2009, Pages 39-43

  Yang, Ru Yuan ^a   Weng, Min Hang ^b   Kuan, Hon ^c  

^a NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

^c SOUTHERN TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

(Zr0.8,Sn0.2)TiO4; C. Dielectric properties; Liquid phase; TEM

Indexed keywords

BUILDING MATERIALS; CERAMIC MATERIALS; CRYSTAL GROWTH; DIELECTRIC PROPERTIES; GRAIN BOUNDARIES; LIQUID PHASE SINTERING; MICROSCOPIC EXAMINATION; MICROWAVES; PHOTODEGRADATION; SINTERING; TIN; X RAY ANALYSIS; ZIRCONIUM;

(ZR0.8,SN0.2)TIO4; BOUNDARY PHASES; BRIGHT FIELDS; C. DIELECTRIC PROPERTIES; ENERGY DISPERSIVE; F VALUES; LIQUID PHASE; MICROWAVE CERAMICS; MICROWAVE PROPERTIES; RAY ANALYSES; TEM; TEM OBSERVATIONS; X-RAY DIFFRACTIONS;

ELECTROMAGNETIC WAVES;

EID: 55949117934     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2007.09.006     Document Type: Article

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