Temperature dependence of macroscopic and microscopic PZT properties studied by thermo-mechanical analysis, dielectric measurements and X-ray diffraction

Ceramics International

Volumn 35, Issue 1, 2009, Pages 45-49

  Seveyrat, L ^a   Lemercier, M ^a   Guiffard, B ^a   Lebrun, L ^a   Guyomar, D ^a  

^a University de Lyon   (France)

Author keywords

B. X ray methods; C. Dielectric properties; C. Thermal properties; D. PZT

Indexed keywords

CHEMICAL ANALYSIS; DIELECTRIC PROPERTIES; DIFFRACTION; FORMING; MECHANICAL PROPERTIES; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; REAL TIME SYSTEMS; SEMICONDUCTING LEAD COMPOUNDS; SUPERCONDUCTING TRANSITION TEMPERATURE; TEMPERATURE; THERMODYNAMIC PROPERTIES; THERMOMECHANICAL TREATMENT; X RAY ANALYSIS; X RAY DIFFRACTION;

B. X-RAY METHODS; C. DIELECTRIC PROPERTIES; C. THERMAL PROPERTIES; COEFFICIENT VALUES; D. PZT; DIELECTRIC MEASUREMENTS; DIELECTRIC METHODS; DIFFERENT SCALES; LATTICE PARAMETERS; MACROSCOPIC METHODS; POLING STATES; SCALE EFFECTS; TEMPERATURE DEPENDENCES; THERMO MECHANICALS; TRANSITION TEMPERATURES; X-RAY DIFFRACTIONS;

X RAY DIFFRACTION ANALYSIS;

EID: 55949094426     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2007.09.010     Document Type: Article

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