Optical reflection from excitonic quantum-dot multilayer structures

Applied Physics Letters

Volumn 93, Issue 18, 2008, Pages

  Fu, Y ^a   Agren H ^a   Hoglund L ^b   Andersson, J Y ^b   Asplund, C ^c   Qiu, M ^a   Thyln L ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b ACREO AB   (Sweden)

^c IRNOVA AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM ALLOYS; INDIUM ARSENIDE; MULTILAYERS; NUMERICAL ANALYSIS; OPTICAL MULTILAYERS; REFLECTION; SEMICONDUCTING INDIUM;

DIELECTRIC CONSTANTS; EXCITONIC ENERGIES; FINITE DIFFERENCE TIME DOMAINS; GAAS SUBSTRATES; INCIDENT RADIATIONS; MULTILAYER STRUCTURES; NUMERICAL CALCULATIONS; OPTICAL REFLECTANCES; OPTICAL REFLECTIONS; QUANTUM MECHANICALS; REFLECTANCE PEAKS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 55849126707     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3021084     Document Type: Article

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