Anti-counterfeiting with a random pattern

Proceedings - 2nd Int. Conf. Emerging Security Inf., Systems and Technologies, SECURWARE 2008, Includes DEPEND 2008: 1st Int. Workshop on Dependability and Security in Complex and Critical Inf. Sys.

Volumn , Issue , 2008, Pages 146-153

  Chong, Cheun Ngen ^a   Jiang, Dan ^a   Zhang, Jiagang ^a   Guo, Long ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b TONGJI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL ARITHMETIC;

BRAND OWNERS; COUNTERFEIT PRODUCTS; GLOBAL PROBLEMS; PHYSICAL UNCLONEABLE FUNCTIONS; RANDOM PATTERNS; SCATTERING PARTICLES; SYSTEM USING; TECHNICAL SOLUTIONS;

RANDOM PROCESSES;

EID: 55849120197     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SECURWARE.2008.12     Document Type: Conference Paper

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